Description: Please refer to the section BELOW (and NOT ABOVE) this line for the product details - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - Title:Encyclopedia Of Scanning Electron MicroscopyISBN13:9781632381668ISBN10:1632381664Author:Page, Lisa (Editor)Description:This Book Focuses On Various Issues Concerned With Scanning Electron Microscopy, As Well As Its Theoretical And Practical Applications Fine Focused Electron And Ion Beams Constitute(S) An Inevitable Part Of Methods And Instruments Employed In Various Science Fields Sems Are Well Instrumented And Supplemented With Advanced Techniques And Methods And Thereby Present Endless Possibilities In The Areas Of Quantitative Measurement Of Object Topologies, Surface Imaging, Performing Elemental Analysis And Local Electrophysical Characteristics Of Semiconductor Structures Creation Of Micro And Nanostructures Involves Extensive Use Of Fine Focused E-Beam Numerous Topics Are Covered Under Two Sections Instrumentation, Methodology And Biology, Medicine For Electronic Industry This Book Includes Contributions By Renowned Researchers And Experts In This Field Binding:Hardcover, HardcoverPublisher:NY RESEARCH PRPublication Date:2015-01-30Weight:1.33 lbsDimensions:0.75'' H x 9'' L x 6'' WNumber of Pages:324Language:English
Price: 108.1 USD
Location: USA
End Time: 2024-09-03T11:10:37.000Z
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Book Title: Encyclopedia of Scanning Electron Microscopy
Number of Pages: 324 Pages
Language: English
Publisher: NY Research Press
Topic: Electron Microscopes & Microscopy
Item Height: 0.8 in
Publication Year: 2015
Illustrator: Yes
Genre: Science
Author: Lisa Page
Item Length: 9 in
Item Width: 6 in
Format: Hardcover
